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Paul S. Ho

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Low-dielectric constant materials IV
Low Dielectric Constant Materials for IC Applications
Diffusion Phenomena in Thin Films and Microelectronic Materials
Electronic Packaging Materials Science VI: Volume 264
Electromigration in Metals Fundamentals to Nano-Interconnects
The New Cambridge Companion to Plotinus
Electromigration in Metals
Low Dielectric Constant Materials for IC Applications
Stress-Induced Phenomena in Metallization Eighth International Workshop on Stress-Induced Phenomena in Metallization