Yervant Zorian profile picture

Yervant Zorian

Is this your author profile? Create an account to customize it!

Stand Alone

Multi-Chip Module Test Strategies
Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing: (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
Records of the 2002 IEEE International Workshop on Memory Technology, Design and Testing