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Fred H. Pollak

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Surface and interface analysis of microelectronic materials processing and growth
Spectroscopic characterization techniques for semiconductor technology III
Spectroscopic characterization techniques for semiconductor technology II
Modern optical characterization techniques for semiconductors and semiconductor devices
Diagnostic Techniques for Semiconductor Materials Processing: Volume 406 (MRS Proceedings)
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices (Proceedings of Spie)
International Conference on Modulation Spectroscopy: 19-21 March 1990, San Diego, California (Proceedings of Spie)
Fred H. Pollak — Books & Biography | Menrva Books | MenrvaBooks