Author Description

Computer Integrated Manufacturing (CIM) represents the new strategy of manufacturing systems based on flexible automation and integration of vital functions. In the domain of quality, this concerns computer aided metrological processes and systems, and computer aided product quality control integrated into CIM systems. Metrological processes in CIM systems are applied to (i) workpieces prior to the cutting process, during the machining process and at the final checkout of parts, (ii) tools during or at the end of the machining process, and (iii) mobile elements and other workstation components. With this approach it is possible to define three domains relating to quality: flexible metrological systems, computer aided metrological functions at FMS workstations, and product quality control (CAI and CIQ systems).