Author Description

The book is essentially about using engineering economics to determine the optimum test strategy for electronics manufacturing test. There are also chapters on design for test economics, time to market issues and field service economics. The basic premise is that the difficult decisions about the optimum choice, from a wide array of very different test technologies, can best be done by using life-cycle cost analysis approaches. Calculation of ROI and the presentation of the recommedations to senior management are also covered. Stress is placed on avoiding sub-optimal decisions caused by taking a narrow (departmental) view and the need to constantly address the key driving forces of electronics - producing higher quality products, at lower prices and getting them to market on time whilst also making use of the latest technologies. The book has been out of print for some time but an electronic version is in development.