Author Description

As more synchrotron facilities are constructed and go online, increasingly more applications of synchrotron radiation will be realized. New high-brilliance sources will provide opportunities for characterization methods which need unprecedented atomic-level sensitivity and specificity and for sophisticated probes of atomic structure and electronic properties. The information gained will guide the design and fabrication of advanced structured materials for high-technology applications. This book illustrates the atomic, electronic, magnetic and structural information that can be obtained using synchrotron-based techniques. Both basic and applied research possibilities are manifold, including studies of solid surfaces and interfaces, electronic materials, metal oxides, glasses, thin films, superconductors, polymers, alloys, multilayer metal systems, and intermetallic compounds. The goal is to illustrate how experiments using intense, tunable and polarized X-ray and vacuum ultraviolet photons can be integrated into a comprehensive materials characterization effort. Topics include: mapping, microprobes, and imaging; diffraction and scattering; photoemission and microphotoemission - fluorescence and microfluorescence and materials characterization with X-ray absorption.