Dimensional Optical Metrology and Inspection for Practical Applications VI 13 April 2017, Anaheim, California, United States
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Author Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Page Count:
122
Publication Date:
2017-01-01
ISBN-10:
1510609415
ISBN-13:
9781510609419
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