
The proceedings of the Seventh symposium on ULSI Process Integration discusses all aspects of process integration. Covered areas include device technologies, 3D integration schemes, memory technologies, gate dielectrics, source-drain engineering, rapid thermal annealing, CMP issues, barrier materials and copper interconnects, multilevel integration structures, packaging concepts for TSV based technologies and SIPs, Ge and III-V technologies, novel memory elements, emerging devices, carbon naotubes, spintronics and polymer electronics.
Page Count:
417
Publication Date:
2011-10-01
ISBN-10:
1566779073
ISBN-13:
9781566779074
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