Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices X 24-25 January 2011, San Francisco, California, United States
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Author Description
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Page Count:
256
Publication Date:
2011-01-01
ISBN-10:
0819484652
ISBN-13:
9780819484659
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