ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis
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Author Description
The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.
Page Count:
660
Publication Date:
2018-07-30
ISBN-10:
162708150X
ISBN-13:
9781627081504
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